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Deol, R.S., Charsley, P. A TEM study of defects in a MOCVD GaInAs layer with a composition fluctuation near the epilayer surface. J Mater Sci Lett 9, 562–564 (1990). https://doi.org/10.1007/BF00725878
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DOI: https://doi.org/10.1007/BF00725878