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An X-ray diffraction procedure for the estimation of the alpha and beta polymorph proportion in sintered silicon carbide

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Journal of Materials Science Letters

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Hubbard, F.H. An X-ray diffraction procedure for the estimation of the alpha and beta polymorph proportion in sintered silicon carbide. J Mater Sci Lett 1, 131–132 (1982). https://doi.org/10.1007/BF00724729

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  • DOI: https://doi.org/10.1007/BF00724729

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