Abstract
The impedance of a circuit including an HTSC film as a function of temperature and frequency has been measured, and the presence of an intrinsic reactance in the HTSC films has been shown. The equivalent scheme of the measuring circuit has been synthesized, and the temperature dependence, type, and value of the HTSC-film reactance has been determined in the transition region nearT c . It is shown that the change of reactance sign with temperature observed earlier by a number of researchers and attributed to the intrinsic property of HTSC-film reactance was rather the result of the T-independent parasite reactive elements while the film impedance was becoming small.
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References
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This work was supported by Grant No. 4077292 from the Israel Ministry of Science and Technology.
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Feldberg, S., Voronel, A., Gore, V. et al. Frequency dispersion of HTSC-film impedance in the MHz range. J Supercond 7, 471–473 (1994). https://doi.org/10.1007/BF00724591
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DOI: https://doi.org/10.1007/BF00724591