References
C. R. TELLIER, M. RABEL and A. J. TOSSER,J. Phys. F. Met. Phys. 8 (1978) 2357.
C. R. PICHARD, A. J. TOSSER and C. R. TELLIER,J. Mater. Sci. 16 (1981) 451.
C. R. PICHARD, C. R. TELLIER, K. C. BARUA and A. J. TOSSER, ibid.16 (1981) 2480.
A. J. TOSSER, C. R. TELLIER and C. R. PICHARD, Proceedings of the 1st International Conference on Applied Modelling and Simulation, Lyon, September 1981, Vol. II (1981) p. 63.
C. R. PICHARD, C. R. TELLIER and A. J. TOSSER,Thin Solid Films 69 (1979) 189.
C. R. TELLIER and A. J. TOSSER, ibid.70 (1980) 225.
C. R. PICHARD, A. J. TOSSER and C. R. TELLIER, ibid.81 (1981) 169.
C. R. PICHARD, C. R. TELLIER and A. J. TOSSER,Phys. Status Solidi (a) 68 (1981) K 171.
P. M. de GROOT, Doctoral Dissertation, Techn. Universität München (May 1981).
A. F. MAYADAS and M. SHATZKES,Phys. Rev. B 1 (1970) 1382.
C. R. TELLIER, C. BOUTRIT and A. J. TOSSER,Thin Solid Films 44 (1977) 201.
C. R. PICHARD, C. R. TELLIER and A. J. TOSSER,J. Mater. Sci. 15 (1980) 2236.
G. WEDLER and W. WIEBAUER,Thin Solid Films 28 (1975) 65.
K. L. CHOPRA, “Thin Film Phenomena” (McGraw-Hill, New York, 1979) Chap. VI.
C. R. PICHARD, C. R. TELLIER and A. J. TOSSER,J. Phys. D 12 (1979) L 101.
C. R. PICHARD, C. R. TELLIER and A. J. TOSSER,Thin Solid Films 69 (1980) 157.
R. SURI, A. P. THAKOOR and K. L. CHOPRA,J. Appl. Phys. 46 (1975) 2574.
A. P. THAKOOR, R. SURI, S. K. SURI and K. L. CHOPRA, ibid.46 (1975) 4777.
A. P. THAKOOR, A. BHATNAGAR and K. L. CHOPRA,Thin Solid Films 36 (1976) 51.
K. L. CHOPRA and A. P. THAKOOR,J. Appl. Phys. 49 (1978) 2855.
R. SURI, A. P. THAKOOR and K. L. CHOPRA,Solid State Commun. 18 (1976) 605.
C. R. TELLIER, C. R. PICHARD and A. J. TOSSER,Thin Solid Films 42 (1977) L31.
J. B. THOMPSON,ibid. 48 (1978) L25.
C. R. TELLIER and A. J. TOSSER,Rev. Phys. Appl. 13 (1978) 441.
C. R. PICHARD, C. R. TELLIER and A. J. TOSSER, Internal Report (1981), in C. R. Tellier and A. J. Tosser, “Size Effects in Thin Films”, (Elsevier Ed, 1982) Chap. 3.
G. C. JAIN and B. S. VERMA,Thin Solid Films 15 (1973) 191.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Pichard, C.R., Khalid-Naciri, A. & Tosser, A.J. Checking the assumption related to the structure of thin metal films from the variations in the Hall coefficient. J Mater Sci Lett 3, 455–460 (1984). https://doi.org/10.1007/BF00724391
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF00724391