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The design and some applications of anin situ SEM scratch tester

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Journal of Materials Science Letters

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References

  1. W. C. BRAINARD and D. H. BUCKLEY, “Dynamic Scanning Electron Microscope Study of Friction and Wear,” NASA TND 7700 (1974).

  2. T. R. BATES, K. C. LUDEMA and W. C. BRAINARD,Wear 30 (1974) 365.

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  3. W. A. GLAESER, ibid.73 (1981) 371.

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  4. S. V. PRASAD and T. H. KOSEL, in Proceedings of the International Conference on Wear of Materials, Reston, VA, April 1983, edited by K. C. Ludema (ASME, 1983) p. 121.

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Authors and Affiliations

  1. Department of Metallurgical Engineering and Materials Science, University of Notre Dame, 46556, Notre Dame, IN, USA

    S. V. Prasad & T. H. Kosel

Authors
  1. S. V. Prasad
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  2. T. H. Kosel
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On leave from the Regional Research Laboratory (CSIR), Trivandrum-695019, India.

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Prasad, S.V., Kosel, T.H. The design and some applications of anin situ SEM scratch tester. J Mater Sci Lett 3, 133–136 (1984). https://doi.org/10.1007/BF00723096

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  • DOI: https://doi.org/10.1007/BF00723096

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