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Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Department of Mechanical and Production Engineering, National University of Singapore, 10 Kent Ridge Crescent, 0511, Singapore, Republic of Singapore

    H. S. Fong, S. C. Lim & P. Y. Lim

Authors
  1. H. S. Fong
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  2. S. C. Lim
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  3. P. Y. Lim
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Fong, H.S., Lim, S.C. & Lim, P.Y. Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface. J Mater Sci Lett 9, 43–45 (1990). https://doi.org/10.1007/BF00722864

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  • DOI: https://doi.org/10.1007/BF00722864

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