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Rutherford backscattering spectroscopy analysis of Ar+ implanted ytrria stabilized zirconia

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Department of Materials Science and Engineering, National Tsing Hua University, 30043, Hsinchu, Taiwan

    J. G. Duh & Y. S. Wu

  2. Institute of Electronics, National Chiao Tung University, 30039, Hsinchu, Taiwan

    B. S. Chiou

Authors
  1. J. G. Duh
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  2. Y. S. Wu
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  3. B. S. Chiou
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Duh, J.G., Wu, Y.S. & Chiou, B.S. Rutherford backscattering spectroscopy analysis of Ar+ implanted ytrria stabilized zirconia. J Mater Sci Lett 9, 916–918 (1990). https://doi.org/10.1007/BF00722170

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  • DOI: https://doi.org/10.1007/BF00722170

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