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High resolution transmission electron microscopy of InP

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Journal of Materials Science Letters

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References

  1. R. SINCLAIR, F. A. PONCE, J. C. BRAWMAN, T. YAMASHUTA and P. PIRONZ, Proceedings of the Microscopic Semiconducting Materials Conferences, Oxford, 1981 (Institute of Physics Conference Series No 60) p. 147.

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Authors and Affiliations

  1. Edward Davies Chemical Laboratories, University College of Wales, Aberystwyth, Wales, UK

    J. O. Williams & E. S. Crawford

  2. Royal Signals and Radar Establishment, St. Andrew's Road, Great Malvern, Worcs., UK

    G. T. Brown & B. Cockayne

Authors
  1. J. O. Williams
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  2. E. S. Crawford
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  3. G. T. Brown
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  4. B. Cockayne
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Williams, J.O., Crawford, E.S., Brown, G.T. et al. High resolution transmission electron microscopy of InP. J Mater Sci Lett 1, 499–502 (1982). https://doi.org/10.1007/BF00721940

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  • DOI: https://doi.org/10.1007/BF00721940

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