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Measuring surface roughness of an optical thin film with scanning tunneling microscopes

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Journal of Materials Science Letters

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References

  1. P. HANSMA,J. Appl. Phys. 16 (1987), references 1–23 therein.

  2. K. HABIB, K. MOORE and R. MEHALIK, Microstructural Science (in press).

  3. K. HABIB and A. HUSAIN, paper presented at Scanning '89, California (April 4–7), p. 40 (1989).

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Authors and Affiliations

  1. Materials Application Department, Kuwait Institute for Scientific Research, P.O. Box 24885, 13109, Safat, Kuwait

    K. Habib

  2. Digital Instruments, Inc., 6780 Cortona Drive, 93117, Santa Barbara, California, USA

    V. Eling & C. Wu

Authors
  1. K. Habib
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  2. V. Eling
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  3. C. Wu
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Habib, K., Eling, V. & Wu, C. Measuring surface roughness of an optical thin film with scanning tunneling microscopes. J Mater Sci Lett 9, 1194 (1990). https://doi.org/10.1007/BF00721888

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  • DOI: https://doi.org/10.1007/BF00721888

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