Skip to main content
SpringerLink
Log in

Single-beam thermal-wave microscopes based on fourier imaging of phase information

  • Contributed Papers
  • Published:
Applied Physics B Aims and scope Submit manuscript

Abstract

Thermal-wave microscopes usually employ different means for periodic heating and for detection. In this paper the reflected part of the focused heating beam is considered as a possible means for detection. In particular the dark-field and the phase contrast methods are studied.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Y.H. Wong, R.L. Thomas, G.F. Hawkins: Appl. Phys. Lett.32, 538 (1978)

    Google Scholar 

  2. S.N. Jasperson, S.E. Schnatterly: Rev. Sci. Instrum.40, 761 (1969)

    Google Scholar 

  3. T. Wilson, C. Sheppard:Theory and Practice of Scanning Optical Microscopy (Academic, London 1984)

    Google Scholar 

  4. E.A. Ash, E.G.S. Parge (eds.):Rayleigh-Wave Theory and Application, Springer Ser. Wave Phen.2 (Springer, Berlin, Heidelberg 1985)

    Google Scholar 

  5. M. Hoppe, A. Thaer: InMicroscopic Methods in Metals, ed. by U. Gonser, Topics Current Phys.40, (Springer, Berlin, Heidelberg 1986)

    Google Scholar 

  6. T. Nguyan, A. Rosencwaig: Appl. Surf. Sci.24, 57–74 (1985)

    Google Scholar 

  7. A. Rosencwaig: Am. Lab.11, 39 (1979)

    Google Scholar 

  8. G. Busse: InScanned Image Microscopy, ed. by E. A. Ash (Academic, London 1980) p. 341

    Google Scholar 

  9. W.B. Jackson, N.M. Amer, A.C. Boccara, D. Fournier: Appl. Opt.20, 1333 (1981)

    Google Scholar 

  10. S. Ameri, E.A. Ash, V. Neuman, C.R. Patts: Electron. Lett.17, 337–338 (1981)

    Google Scholar 

  11. M.A. Olmstead, N.M. Amer: J. Vac. Sci. Technol.B 1, 751–755 (1983)

    Google Scholar 

  12. A. Rosencwaig, J. Opsal, W.L. Smith, D.L. Willenborg: Appl. Phys. Lett.46, 1013 (1985)

    Google Scholar 

  13. L. Chen, K.H. Yang, S.Y. Zhang: Appl. Phys. Lett.50, 1349–1351 (1987)

    Google Scholar 

  14. A. Lörincz, L. Andor: InPhotothermal and Photoacoustic Phenomena, ed. by P. Hess, J. Pelzl, Springer Ser. Opt. Sci.58 (Springer, Berlin, Heidelberg 1988)

    Google Scholar 

  15. W.B. Jackson, N.M. Amer: J. Appl. Phys.51, 3343–3353 (1980)

    Google Scholar 

  16. W. Nowacki:Thermoelasticity (Pergamon, Oxford 1962)

    Google Scholar 

  17. M.A. Olmstead, N.M. Amer, S. Kohn, D. Fournier, A.C. Boccara: Appl. Phys. A32, 141–154 (1983)

    Google Scholar 

  18. C.J.R. Sheppard, T. Wilson: Philos. Trans. R. Soc.295, 513–536 (1980)

    Google Scholar 

  19. H.H. Hopkins: Proc. R. Soc. Lond. A231, 408–432 (1953)

    Google Scholar 

  20. C.J.R. Sheppard, T. Wilson: Acta25, 315–325 (1978)

    Google Scholar 

  21. M. Born, E. Wolf:Principles of Optics (Pergamon, Oxford 1975)

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Physics, Institute of Isotopes, The Hungarian Academy of Sciences, P.B. Box 77, H-1525, Budapest, Hungary

    A. Lörincz

Authors
  1. A. Lörincz
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Lörincz, A. Single-beam thermal-wave microscopes based on fourier imaging of phase information. Appl. Phys. B 47, 35–40 (1988). https://doi.org/10.1007/BF00696206

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00696206

PACS

Search

Navigation