Abstract
Bi x Se1−x thin films have been studied because of their structural and optical properties with a view to judging their suitability as the recording medium in phase-change type optical recording. Amorphous films deposited at room temperature were crystallized by thermal annealing. X-ray diffraction analysis and surface morphological studies are reported. A maximum reflectivity difference of 25% at λ=830 nm was obtained upon amorphous-to-crystalline transition. The optical constants calculated by the Newton-Raphson method using the experimental transmittance, reflectance and thickness data are reported.
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Sripathi, Y., Reddy, G.B. & Malhotra, L.K. Structural and optical properties of Bi x Se1−x films. J Mater Sci: Mater Electron 3, 164–167 (1992). https://doi.org/10.1007/BF00695514
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DOI: https://doi.org/10.1007/BF00695514