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Analyse von synthetischem Bornitrid durch Elektronenbeugung

Analysis of synthetic boron nitride by electron diffraction

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Literatur

  1. American Society for Testing Materials; X-Ray Diffraction Cards, published by the Joint Committee on Chemical Analysis by X-Ray Diffraction Methods, Philadelphia 1964; 20–174

  2. wie[1], 18–251

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Authors and Affiliations

  1. National Institute for Researches in Inorganic Materials, Sakura-mura, Niiharigun, 300-31, Ibaraki-ken, Japan

    S. Yamaguchi & Y. -T. Hasegawa

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  1. S. Yamaguchi
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  2. Y. -T. Hasegawa
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Yamaguchi, S., Hasegawa, Y.T. Analyse von synthetischem Bornitrid durch Elektronenbeugung. Z. Anal. Chem. 294, 43 (1979). https://doi.org/10.1007/BF00694661

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  • DOI: https://doi.org/10.1007/BF00694661

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