Fresenius' Zeitschrift für analytische Chemie

, Volume 294, Issue 1, pp 43–43 | Cite as

Analyse von synthetischem Bornitrid durch Elektronenbeugung

  • S. Yamaguchi
  • Y. -T. Hasegawa
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Key words

Analyse von Bornitrid Elektronenbeugung synthetischer BN 

Analysis of synthetic boron nitride by electron diffraction

Literatur

  1. 1.
    American Society for Testing Materials; X-Ray Diffraction Cards, published by the Joint Committee on Chemical Analysis by X-Ray Diffraction Methods, Philadelphia 1964; 20–174Google Scholar
  2. 2.
    wie[1], 18–251Google Scholar

Copyright information

© Springer-Verlag 1979

Authors and Affiliations

  • S. Yamaguchi
    • 1
  • Y. -T. Hasegawa
    • 1
  1. 1.National Institute for Researches in Inorganic MaterialsIbaraki-kenJapan

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