Abstract
The lifetime of a metastable current state of a tunnel junction is reduced under the action of a weak microwave perturbation. The dependence of the lifetime on pumping frequency is found and describes the experimental data. At a very highQ-factor, frequent sharp dips appear in the dependence of the lifetime on pumping frequency. These dips are connected with the quantum properties of the phase of the order parameter.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
M. H. Devoret, J. M. Martinis, D. Esteve, and J. Clarke,Phys. Rev. Lett. 53, 1260 (1984).
A. I. Larkin and Yu. N. Ovchinnikov,Phys. Rev. B 28, 6281 (1983).
V. Ambegaokar, U. Eckern, and G. Schon,Phys. Rev. Lett. 48, 1745 (1982).
A. I. Larkin and Yu. N. Ovchinnikov,Zh. Eksp. Teor. Fiz. 87, 1842 (1984).
M. I. Dykman and M. A. Krivoglaz,Zh. Eksp. Teor. Fiz. 77, 60 (1979).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Larkin, A.I., Ovchinnikov, Y.N. Resonance reduction of the lifetime of the metastable state of tunnel junctions. J Low Temp Phys 63, 317–329 (1986). https://doi.org/10.1007/BF00683771
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF00683771