Journal of Low Temperature Physics

, Volume 61, Issue 5–6, pp 401–412 | Cite as

Frequency dependence of the specular and diffuse phonon scattering from silicon surfaces

  • S. Burger
  • K. Lassmann
  • W. Eisenmenger
Article

Abstract

Phonon backscattering experiments with polished silicon surfaces show that there is no Kapitza anomaly at frequencies corresponding to the aluminum junction detector threshold (∼80 GHz), whereas at higher frequencies the anomalous transmission into liquid helium or solid nitrogen increases (reduced backscattering by the coverage), closely related to the increase of the diffuse scattering at the uncovered surface.

Keywords

Nitrogen Aluminum Silicon Helium Magnetic Material 

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Copyright information

© Plenum Publishing Corporation 1985

Authors and Affiliations

  • S. Burger
    • 1
  • K. Lassmann
    • 1
  • W. Eisenmenger
    • 1
  1. 1.Physikalisches Institut Teil 1Universität StuttgartWest Germany

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