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Journal of Low Temperature Physics

, Volume 70, Issue 3–4, pp 253–277 | Cite as

Characterization of defects in amorphous type II superconductors using the collective flux pinning properties

  • R. Wördenweber
  • A. Pruymboom
  • P. H. Kes
Article

Abstract

As in crystalline materials, flux pinning in type II superconducting metallic glasses arises from the interaction of the flux-line lattice with defects that locally change the superconducting properties of the sample. The nature of these defects is still subject of numerous investigations. In this paper we demonstrate that the collective pinning properties of weak pinning, type II superconductors provide an ideal additional tool for probing defects of sizes comparable to the coherence length ξ. Our results obtained from sputtered Nb X Ge and Mo X Si layers sketch a straightforward relation between the sputter conditions, the resulting defects, and the pinning behavior. A classification of the defects that provide the pinning is given and estimates on their sizes and densities are derived. They are in excellent agreement with other (direct) observations.

Keywords

Coherence Magnetic Material Excellent Agreement Numerous Investigation Metallic Glass 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Publishing Corporation 1988

Authors and Affiliations

  • R. Wördenweber
    • 1
  • A. Pruymboom
    • 1
  • P. H. Kes
    • 1
  1. 1.Kamerlingh Onnes LaboratoryRijksuniversiteit LeidenLeidenThe Netherlands

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