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Temperature and magnetic field dependence of NbN film resistivity: 3D weak localization effects

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Abstract

Niobium nitride superconducting films have been deposited by reactive rf magnetron sputtering. Polyepitaxial growth on MgO-coated substrates greatly improves the superconducting properties. The overall film resistivity is found to be widely dependent on the total pressure of the gas mixture. Samples with a negative temperature coefficient of resistance exhibit 3D weak localization effects as characterized by magnetoresistance measurements. The inelastic scattering time is found to vary as T−p with p≃2, in the temperature range Tc-3Tc.

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Laboratoire associé au C.N.R.S.

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Pellan, Y., Dousselin, G., Pinel, J. et al. Temperature and magnetic field dependence of NbN film resistivity: 3D weak localization effects. J Low Temp Phys 78, 63–77 (1990). https://doi.org/10.1007/BF00682110

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