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Metrological certification for X-ray-spectral fluorescence analysis (XFA)

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Literature cited

  1. V. V. Gorbachev and D. L. Orlov, “Computerized XFA systems in the glass industry,” in: Glass and Glass-Ceramic Chemistry and Technology: State Glass Institute Papers [in Russian] (1983), pp. 3–9.

  2. V. V. Gorbachev, D. L. Orlov, A. S. Bystrikov, and N. P. Ignat'ev, “Prospects for using x-ray spectral analysis,” Steklo Keram., No. 9, 8–9 (1985).

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  3. V. E. Manevich, V. V. Gorbachev, G. P. Lisovskaya, and M. L. Pershin, “X-ray spectral analysis for the compositions of glass and glass charges,” Steklo Keram., No. 7, 7–9 (1984).

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Translated from Steklo i Keramika, No. 7, pp. 30–31, July, 1989.

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Chesnokov, A.G., Gorbachev, V.V., Solov'eva, I.N. et al. Metrological certification for X-ray-spectral fluorescence analysis (XFA). Glass Ceram 46, 316–318 (1989). https://doi.org/10.1007/BF00677719

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  • DOI: https://doi.org/10.1007/BF00677719

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