Abstract
We report a study of the inhomogeneities in thin helium films due to the van der Waals potential by a resonant acoustical technique. The van der Waals constant between helium and quartz is estimated to be α=65±5 K (layer)3; the model leads to a solid helium layer on the substrate of the order ofH=2.2a 0 . A comparison is made with data extracted from interferometric acoustical methods and third-sound type experiments.
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Associated with the Centre National de la Recherche Scientifique.
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Lambert, B., Perzynski, R., Salin, D. et al. Inhomogeneities in thin helium films. J Low Temp Phys 28, 359–368 (1977). https://doi.org/10.1007/BF00668223
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DOI: https://doi.org/10.1007/BF00668223