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Journal of Applied Spectroscopy

, Volume 44, Issue 5, pp 482–485 | Cite as

Photoluminescent study of the formation of dislocation structure in silicon under the influence of scanning laser radiation

  • A. V. Demchuk
  • N. M. Kazyuchits
  • A. M. Pristrem
  • N. I. Danilovich
  • A. A. Patrin
Article

Keywords

Radiation Silicon Analytical Chemistry Molecular Structure Laser Radiation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Publishing Corporation 1986

Authors and Affiliations

  • A. V. Demchuk
  • N. M. Kazyuchits
  • A. M. Pristrem
  • N. I. Danilovich
  • A. A. Patrin

There are no affiliations available

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