Journal of Applied Spectroscopy

, Volume 44, Issue 5, pp 482–485 | Cite as

Photoluminescent study of the formation of dislocation structure in silicon under the influence of scanning laser radiation

  • A. V. Demchuk
  • N. M. Kazyuchits
  • A. M. Pristrem
  • N. I. Danilovich
  • A. A. Patrin
Article
  • 14 Downloads

Keywords

Radiation Silicon Analytical Chemistry Molecular Structure Laser Radiation 

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Copyright information

© Plenum Publishing Corporation 1986

Authors and Affiliations

  • A. V. Demchuk
  • N. M. Kazyuchits
  • A. M. Pristrem
  • N. I. Danilovich
  • A. A. Patrin

There are no affiliations available

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