Abstract
The effect of temperature on copper oxide scale morphology was studied during in situ oxidation of OFHC copper in a hot-stage environmental scanning electron microscope (HSESEM). Cuprous oxide scales grown at low temperature [0.2Tm(Cu2O)] and intermediate temperatures 0.6–0.7Tm(Cu2O)] were found to be crystallographically oriented. At intermediate temperatures, scales exhibited nonplanar features such as ridges and growth pyramids. At high temperatures [T> 0.8Tm(Cu2O)], scales had planar morphologies and a few dislocation growth pits. Downquenching and upquenching of the Cu2O scales from steady-state oxidation temperatures induced morphological changes such as cavity formation and surface reconstruction.
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Önay, B., Rapp, R.A. In Situ observation of the effect of temperature on Cu2O scale morphology. Oxid Met 29, 473–486 (1988). https://doi.org/10.1007/BF00666846
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DOI: https://doi.org/10.1007/BF00666846