Advertisement

Oxidation of Metals

, Volume 33, Issue 5–6, pp 357–369 | Cite as

Effect of internal oxidation pretreatments and Si contamination on oxide-scale growth and spalling

  • P. Y. Hou
  • J. Stringer
Article

Abstract

Internal oxidation pretreatments carried out in quartz capsule with a Rhines pack were found to have a profound effect on the subsequent oxidation behavior of alloys. Specimens of Co-15 wt.% Cr, Co-25 wt.% Cr, Ni-25 wt.% Cr, and Ni-25 wt.% Cr-1 wt.% Al were tested at 1100°C after pre-oxidation treatments. Even without the development of internal oxide particles, pretreated binary CoCr and NiCr alloys oxidized with significantly lower rates. Selective oxidation of chromium was observed on the non-Cr2O3-forming Co-base alloys, whereas on the Cr2O3-forming Ni-base alloys, elimination of base-metal oxide, reduction in the Cr2O3 growth rate, and better scale adhesion were found. These effects were more apparent with pre-oxidation temperatures greater than 1000°C and with longer pretreatment times. Contaimination of Si from the quartz is believed to be the cause.

Key words

silicon internal oxidation Cr2O3, reactive-element effect 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    D. P. Whittle and J. Stringer,Phil. Trans. Roy. Soc. London,A27, 309 (1979).Google Scholar
  2. 2.
    J. Stringer and P. Y. Hou, inCorrosion and Particle Erosion at High Temperatures, V. Srinivasan and K. Vedula, eds. (TMS Pub., 1989), p. 383.Google Scholar
  3. 3.
    J. Stringer,Mat. Sci. and Eng. (in press).Google Scholar
  4. 4.
    G. R. Wallwork and A. Z. Hed,Oxid. Met. 3, 229 (1971).Google Scholar
  5. 5.
    C. S. Giggins and F. S. Pettit,Met. Trans. 2, 1071 (1971).Google Scholar
  6. 6.
    D. P. Whittle, M. E. El Dahshan, and J. Stringer,Corros. Sci. 17, 879 (1977).Google Scholar
  7. 7.
    I. G. Wright, B. A. Wilcox, and R. I. Jaffee,Oxid. Met. 9, 275 (1975).Google Scholar
  8. 8.
    H. T. Michels,Met. Trans. 7A, 379 (1976).Google Scholar
  9. 9.
    L. M. Kingsley and J. Stringer,Oxid. Met. 32, 371 (1989).Google Scholar
  10. 10.
    P. Y. Hou and J. Stringer,J. Electrochem. Soc. 134, 1836–1849 (1987).Google Scholar
  11. 11.
    P. Y. Hou and J. Stringer,Proc. Symp. on Adhesion in Solids, Vol. 119, 205–211, MRS Spring meeting, Reno, Nevada, April 5–9 (1988).Google Scholar
  12. 12.
    R. J. Blattner and C. A. Evans, Jr.,Scanning Electron Microscopy,4, 55–65 (1980).Google Scholar
  13. 13.
    J. G. Smeggil, inCorrosion and Particle Erosion at High Temperatures, V. Srinivasan and K. Vedula, eds. (TMS Pub., 1989), p. 403.Google Scholar
  14. 14.
    J. L. Smialek,Met. Trans.,18A, 164–167 (1987).Google Scholar
  15. 15.
    D. Caplan and M. Cohen,J. Electrochem. Soc.,108, 438–441 (1961).Google Scholar
  16. 16.
    D. E. Jones and J. Stringer,Oxid. Met. 9, 409 (1975).Google Scholar

Copyright information

© Plenum Publishing Corporation 1990

Authors and Affiliations

  • P. Y. Hou
    • 1
  • J. Stringer
    • 2
  1. 1.Materials and Chemical Sciences DivisionLawrence Berkeley LaboratoryBerekeley
  2. 2.Electric Power Research InstitutePalo Alto

Personalised recommendations