Skip to main content
SpringerLink
Log in

Apparatus for gauging the thickness of optical coatings according to transmission extrema

  • Published:
Journal of Applied Spectroscopy Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. Sh. A. Furman, Thin Optical Coatings [in Russian], Mashinostroenie, Leningrad (1977).

    Google Scholar 

  2. L. B. Katsnel'son, “Methods for gauging the optical thickness of interference films deposited in a vacuum,” Opt. Mekh. Prom., No. 4, 50–58 (1969).

    Google Scholar 

  3. L. Khollend, Deposition of Thin Films in a Vacuum [in Russian], Gosenergoizdat, Moscow (1962).

    Google Scholar 

  4. G. Hass (ed.), Physics of Thin Films: Advances in Research and Development, Vol. 3, Academic Press (1966).

  5. G. V. Rozenberg, Optics of Thin Coatings [in Russian], Fizmatgiz, Moscow (1958), p. 121.

    Google Scholar 

  6. P. G. Kard, Analysis and Synthesis of Multilayered Interference Films [in Russian], Valgos, Tallin (1971).

    Google Scholar 

  7. E. A. Nesmelov and G. P. Konyukhov, “Calculation of the coefficients of reflection of light by thin dielectric coating,” Opt. Mekh. Prom., No. 10, 10–12 (1961).

    Google Scholar 

Download references

Authors
  1. R. Kh. Fazylzyanov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Kh. Sh. Khakimov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. I. S. Gainutdinov
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Zhurnal Prikladnoi Spectroskopii, Vol. 38, No. 6, pp. 978–982, June, 1983.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Fazylzyanov, R.K., Khakimov, K.S. & Gainutdinov, I.S. Apparatus for gauging the thickness of optical coatings according to transmission extrema. J Appl Spectrosc 38, 716–720 (1983). https://doi.org/10.1007/BF00666716

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00666716

Keywords

Search

Navigation