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Reflection-absorption spectroscopy in determining thickness and optical-constant dispersion in ultrathin films

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 40, No. 5, pp. 796–800, May, 1984.

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Tolstoi, V.P., Bogdanova, L.P., Yurchenko, V.V. et al. Reflection-absorption spectroscopy in determining thickness and optical-constant dispersion in ultrathin films. J Appl Spectrosc 40, 573–576 (1984). https://doi.org/10.1007/BF00661467

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  • DOI: https://doi.org/10.1007/BF00661467

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