Literature cited
V. A. Kizel' (Kiesel), The Reflection of Light [in Russian], Nauka, Moscow (1973), p. 217.
M. M. Gorshkov, Ellipsometry [in Russian], Sovetskoe Radio, Moscow (1974), p. 38.
A. V. Rzhanov, The Principles of Ellipsometry [in Russian], Nauka, Novosibirsk (1979), p. 52.
A. I. Kurnosov and V. V. Yudin, The Technology of Producing Semiconductor Devices [in Russian], Vysshaya Shkola, Moscow (1974), p. 39.
V. B. Karanov and M. Yu. Sakhnovskii, Zh. Prikl. Spektr.,35, No. 5, 831 (1982).
Yu. I. Ukhanov, The Optical Properties of Semiconductors [in Russian], Nauka, Moscow (1977), p. 58.
K. K. Svitashev, A. I. Semenenko, L. V. Semenenko, et al., Opt. Spektr.,43, No. 1 161 (1977).
A. P. Ivanov, The Optics of Scattering Media [in Russian], Nauka i Tekhnika, Minsk (1969), p. 56.
H. E. Bennett and J. O. Porteus, JOSA,51, No. 2, 123 (1961).
M. Yu. Sakhnovskii, Opt. Spektrosk.,58, No. 1, 130 (1985).
C. A. Fenstermaker and F. L. McCracking, Surf. Sci.,16, 85 (1961).
G. P. Peka, Physical Phenomena on the Surface of Semiconductors [in Russian], Vishcha Shkola, Kiev (1984).
Additional information
Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 44, No. 4, pp. 623–627, April, 1986.
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Karavanov, V.B., Sakhnovskii, M.Y. Influence of the quality of surface polishing of Ge single crystals upon their optical constants. J Appl Spectrosc 44, 384–387 (1986). https://doi.org/10.1007/BF00661056
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DOI: https://doi.org/10.1007/BF00661056