Journal of Applied Spectroscopy

, Volume 50, Issue 2, pp 151–156 | Cite as

Measurement of the intensities and collisional broadening of rotational lines of the 4.5 μm band of N2O with the help of a tunable semiconductor laser

  • V. V. Zhurov
  • V. V. Kovtun
  • N. N. Kudryavtsev
Article
  • 12 Downloads

Keywords

Analytical Chemistry Molecular Structure Semiconductor Laser Rotational Line Tunable Semiconductor 

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Copyright information

© Plenum Publishing Corporation 1989

Authors and Affiliations

  • V. V. Zhurov
  • V. V. Kovtun
  • N. N. Kudryavtsev

There are no affiliations available

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