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Comparative analysis of reflection and surface polariton spectroscopies as methods for the determination of intrinsic plasma frequencies in semiconductors

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Authors and Affiliations

  1. Semiconductor Institute, Ukrainian Academy of Science, Kiev

    E. F. Venger, A. V. Goncharenko, Yu. A. Pasechnik & A. V. Mel'nichuk

Authors
  1. E. F. Venger
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  2. A. V. Goncharenko
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  3. Yu. A. Pasechnik
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  4. A. V. Mel'nichuk
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Additional information

Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 56, No. 3, pp. 461–466, March, 1992.

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Venger, E.F., Goncharenko, A.V., Pasechnik, Y.A. et al. Comparative analysis of reflection and surface polariton spectroscopies as methods for the determination of intrinsic plasma frequencies in semiconductors. J Appl Spectrosc 56, 291–295 (1992). https://doi.org/10.1007/BF00659114

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  • DOI: https://doi.org/10.1007/BF00659114

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