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Spectral analysis of silicon by the evaporation method

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Abstract

A study is reported of the effects of the form taken by impurities in silicon on quantitative determinations. The limit of detection for 1 g samples is established for several impurities. Radioactive isotopes have been used to show that the conditions of distillation cause very volatile impurities to evaporate completely, though between 10 and 30% may condense outside the central capsule. This dispersal has been observed also for a nonvolatile base (zirconia). It is shown that the degree of condensation depends very little on the impurity content down to 5×10−10 g in a nonvolatile base. Boron shows some unusual features.

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References

  1. Kh. I. Zil'bershtein, M. M. Piryutko, T. P. Evtushenko, I. L. Sakharnova, and O. N. Nikitina, Zav. Lab. 25, 12, 1474, 1959.

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  2. Kh. I. Zil'bershtein, M. M. Piryutko, O. N. Nikitina, M. P. Semov, and Yu. F. Fedorov, Reinststoffe in Wissenschaft und Technik, International Symposium, 30 November–2 December, 1961 in Dresden, Akademie-Verlag, Berlin, S. 389, 1963.

    Google Scholar 

  3. Yu. V. Morachevskii, Kh. I. Zil'bershtein, M. M. Piryutko, and O. N. Nikitina, Zhurnal Analitcheskoi Khimii, 27, 5, 614, 1962.

    Google Scholar 

  4. Yu. I. Belyaev, Dissertation, Institute of Geochemistry and Analytical Chemistry, (GEOKhI) Academy of Sciences USSR, 1956; A. N. Zaidel, N. I. Kaliteevskii, L. V. Lipis, and M. P. Chaika, Emission Spectral Analysis of Nuclear Materials [in Russian], Moscow-Leningrad, chapter 8, 1960.

  5. W. Geilmann, Z. f. anal. Chemie, 160, 6, 410, 1958.

    Google Scholar 

  6. P. Clausing, Z. f. Physik, 66, 7–8, 471, 1930.

    Google Scholar 

  7. S. A. Vekshinskii, A New Method for Metallographic Examination of Alloys [in Russian], Moscow-Leningrad, p. 23, 1944; S. Metfessel, Preparation and Measurement of Thin Films [in Russian], Moscow-Leningrad, pp. 25–26, 1963; H. Mayer, Z. f. Physik, 58, 5–6, 373, 1929.

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Authors
  1. Kh. I. Zil'bershtein
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  2. M. P. Semov
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Zil'bershtein, K.I., Semov, M.P. Spectral analysis of silicon by the evaporation method. J Appl Spectrosc 2, 9–11 (1965). https://doi.org/10.1007/BF00658075

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  • DOI: https://doi.org/10.1007/BF00658075

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