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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 46, No. 5, pp. 775–780, May, 1987.
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Gruzinov, S.N., Tolstoi, V.P. Reflection-absorption of ultrathin films on the surface of semiconductors and dielectrics by the method of IR spectroscopy. J Appl Spectrosc 46, 480–484 (1987). https://doi.org/10.1007/BF00657373
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DOI: https://doi.org/10.1007/BF00657373