Skip to main content
SpringerLink
Log in

Quality control for optically flat surfaces

  • Published:
Journal of Applied Spectroscopy Aims and scope

Abstract

Multiple-beam interferometry at a range of frequencies is used in a device for testing optical flats to 0. 01 wavelength or better.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. D. R. Herriott, JOSA, 51, 1142, 1961.

    Google Scholar 

  2. G. S. Landsberg, Optics [in Russian], GITTL, Moscow, 1952.

    Google Scholar 

  3. G. V. Rozenberg, Optics of Thin Films [in Russian], Fizmatgiz, Moscow, 1958.

    Google Scholar 

Download references

Authors
  1. L. I. Berezhinskii
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. L. P. Lisitsa
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Berezhinskii, L.I., Lisitsa, L.P. Quality control for optically flat surfaces. J Appl Spectrosc 2, 263–266 (1965). https://doi.org/10.1007/BF00656790

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00656790

Keywords

Search

Navigation