Abstract
ThinZnMn films (200–3000 ppmMn) are quench condensed in uhv onto quartz plates held at 5 K. Their resistance is measured down to 0.35 K and then again after stepwise annealing to higher temperatures (maxT a =350 K). In the lower concentrated films we find an increase by 25% of the slope of the curves in the range where ρ is proportional to logT while increasingT a to 300 K. This is explained by the decrease in nonmagnetic defect concentration during the annealing process. Further analysis of the data shows that there is also a strengthening of the Rudermann-Kittel interaction between the magnetic impurities because of the increasing mean free path of the conduction electrons during annealing. The effect is more pronounced in the higher concentrated alloy films, where a maximum in the resistance curve is observed similar to bulk material alloy samples.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
J. Kondo,Progr. Theoret. Phys. (Kyoto)34, 372 (1965).
K. Fischer,Springer Tracts Mod. Phys. 54, 1 (1970).
K. Fischer,Z. Physik 225, 444 (1969).
D. Gainon and A. J. Heeger,Phys. Rev. Letters 22, 1420 (1969).
J. W. Loram, T. E. Whall, and P. J. Ford,Phys. Rev. B2, 857 (1970).
J. S. Schilling, W. B. Holzapfel, and E. Lüscher,Phys. Letters 38A, 129 (1971).
M. Dietrich, W. Gey, and E. Umlauf,Solid State Commun. 11, 655 (1972).
A. Kraut and H. Wollenberger,Solid State Commun. 9, 1169 (1971).
E. F. Wassermann, H. Falke, and H. P. Jablonski,Solid State Commun. 9, 1171 (1971).
D. Korn,Z. Physik 238, 275 (1970).
H. P. Falke, H. P. Jablonski, J. Kästner, and E. F. Wassermann, to be published inZ. Physik.
E. F. Wassermann,Z. Physik 234, 347 (1970).
A. v. Bassewitz and G. v. Minnegerode,Z. Physik 181, 368 (1964).
G. T. Meaden,Electrical Resistance of Metals (Plenum Press, New York, 1965).
A. Desalvo, P. Gondi, F. A. Levi, and F. Zignani,Nuovo Cimento 31, 904 (1964).
K. P. Bohnen and K. Fischer,Z. Physik 248, 220 (1971).
D. R. Hamann,Phys. Rev. 158, 570 (1967).
P. J. Ford, C. Rizzuto, E. Salamoni, and P. Zani,J. de Physique, Colloque C1,32, 221 (1971); P. J. Ford, C. Rizzuto, and E. Salamoni,Phys. Rev. B6, 1851 (1972).
K. Matho and M. T. Beal-Monod,Phys. Rev. B5, 1899 (1972); and references therein.
P. G. de Gennes,J. Phys. Radium 23, 620 (1962).
F. T. Hedgcock and C. Rizzuto,Phys. Rev. 163, 517 (1967).
R. Hasegawa and C. C. Tsuei,Phys. Rev. B2, 1631 (1970).
G. Boato, M. Bugo, and C. Rizzuto,Nuovo Cimento 45, 226 (1966).
W. Schlabitz, E. F. Wassermann, and H. P. Falke,J. Low Temp. Phys. 10, 583 (1973).
F. W. Smith,J. Low. Temp. Phys. 5, 683 (1971).
R. S. Newrock, B. Serin, J. Vig, and G. Boato,J. Low Temp. Phys. 5, 701 (1971).
Author information
Authors and Affiliations
Additional information
Part of this work was presented at the LT-13 Conference at Boulder, Colorado, in 1972.
Rights and permissions
About this article
Cite this article
Falke, H.P., Jablonski, H.P. & Wassermann, E.F. Influence of lattice defects on the Kondo resistance anomaly in diluteZnMn thin film alloys. J Low Temp Phys 11, 53–63 (1973). https://doi.org/10.1007/BF00655036
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF00655036