Abstract
Experiments have been carried out using a miniature tensometer in a scanning electron microscope to obtain high-precision mechanical tensile test data on needle-shaped crystals of (SN) x . Extensions as low as 10 nm can be measured over a gauge length of varied size from a few millimetres down to a few microns. Loads were applied in a range of 0.1–10 N and measured with a sensitivity of 0.006 N. Young's modulus parallel to the chain axis of (SN) x was measured as 1.3 × 1010 N m−2, the crystals yielded at 1.3 × 108 N m−2 at a strain of 0.9%, tensile strength was determined at 2.1 × 108 N m−2.
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Hoel, R.H., Dingley, D.J. Precision tensile testing of small specimens of polysulphur nitride in the scanning electron microscope. J Mater Sci 17, 2990–2996 (1982). https://doi.org/10.1007/BF00644680
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DOI: https://doi.org/10.1007/BF00644680