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Electrical and thermal properties of highly quenched amorphous V2O5 thin films

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Abstract

Amorphous thin films of V2O5 have been prepared by vapour deposition in high vacuum (∼ 10−6 torr). In order to study the role of quenching, various temperatures, ranging from −196 to 260° C, have been selected for the substrate. Differential thermal analysis. X-ray diffraction and conductivity measurements clearly divide the material into two sets, depending on the efficiency of the quenching. Whereas the least-quenched samples resemble those previously obtained by splat-cooling, the better quenched are only barely stable and, as a consequence, exhibit unique features, such as the occurrence of a glassy transition and the highest crystallization temperature ever found for V2O5.

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Audiere, J.P., Madi, A. & Grenet, J.C. Electrical and thermal properties of highly quenched amorphous V2O5 thin films. J Mater Sci 17, 2973–2978 (1982). https://doi.org/10.1007/BF00644678

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