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The georgia tech high sensitivity microwave measurement system

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Abstract

As observations and models of the planets become increasingly more accurate and sophisticated, the need for highly accurate laboratory measurements of the microwave properties of the component gases present in their atmospheres become ever more critical. This paper describes the system that has been developed at Georgia Tech to make these measurements at wavelengths ranging from 13.3 cm to 1.38 cm with a sensitivity of 0.05 dB/km at the longest wavelength and 0.6 dB/km at the shortest wavelength.

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Authors and Affiliations

  1. School of Electrical and Computer Engineering, Georgia Institute of Technology, 30332-0250, Atlanta, GA

    David R. Deboer & Paul G. Steffes

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  1. David R. Deboer
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  2. Paul G. Steffes
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Deboer, D.R., Steffes, P.G. The georgia tech high sensitivity microwave measurement system. Astrophys Space Sci 236, 111–124 (1996). https://doi.org/10.1007/BF00644325

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  • DOI: https://doi.org/10.1007/BF00644325

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