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Analysis of sensitivity and low-frequency intensity noise characteristics of Bragg reflector lasers induced by reflected light

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Abstract

An analysis of the sensitivity and low-frequency intensity noise characteristics of Bragg reflector lasers is given. It is found that Bragg reflector lasers have increased sensitivity to reflected light for low grating coupling strength (кl) and is similar to that of Fabry-Perot lasers except for highКl values. Also, the intensity noise can be reduced by operating the device at high injection level.

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References

  1. T. Morikawa, Y. Mitsuhara, J. Shimada andY. Kojima,Electron. Lett. 12 (1976) 435.

    Google Scholar 

  2. R. F. Broom, E. Mohn, C. Risch andR. Salathe,IEEE J. Quantum Electron. QE-6 (1970) 328.

    Google Scholar 

  3. T. Hayakawa, personal communication.

  4. O. Hirota andY. Suematsu,IEEE J. Quantum Electron. QE-15 (1979) 142.

    Google Scholar 

  5. H. Temkin, N. A. Olsson, J. H. Abeles, R. A. Logan andM. B. Panish,ibid. QE-22 (1986) 286.

    Google Scholar 

  6. W. Streifer, R. D. Burnham andD. R. Scrifres,ibid. QE-11 (1975) 154.

    Google Scholar 

  7. R. Lang andK. Kobayashi,ibid. QE-16 (1980) 347.

    Google Scholar 

  8. K. Komori, Y. Tohmori, S. Arai andY. Suematsu,Trans. IECE Jpn. E68 (1985) 742.

    Google Scholar 

  9. N. Eda, K. Furuya, F. Koyama andY. Suematsu,IEEE/OSA J. Lightwave Tech. LT-3 (1985) 400.

    Google Scholar 

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Author notes

  1. T. Tanbun-Ek

    Present address: AT&T Bell Laboratories, 600 Mountain Avenue, 07974, Murray Hill, New Jersey, USA

Authors and Affiliations

  1. The Swedish Institute of Microelectronics, PO Box 1084, S-164 21, Kista, Sweden

    T. Tanbun-Ek

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  1. T. Tanbun-Ek
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Tanbun-Ek, T. Analysis of sensitivity and low-frequency intensity noise characteristics of Bragg reflector lasers induced by reflected light. Opt Quant Electron 20, 485–492 (1988). https://doi.org/10.1007/BF00635749

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  • DOI: https://doi.org/10.1007/BF00635749

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