Abstract
The photothermal deflection technique has been extended as a contactless method to investigate thermal transport in thin films. A theoretical model is developed which quantitatively describes the transport behavior, and is shown to be in excellent agreement with experimental results. This approach yields the thermal diffusivity directly and in a spatially-resolved manner.
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Skumanich, A., Dersch, H., Fathallah, M. et al. A contactless method for investigating the thermal properties of thin films. Appl. Phys. A 43, 297–300 (1987). https://doi.org/10.1007/BF00635187
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DOI: https://doi.org/10.1007/BF00635187