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Applied Physics A

, Volume 36, Issue 3, pp 121–123 | Cite as

Magnetic-structure analysis in scanning electron beam devices by means of the LEED Spin-polarization detector

  • J. Kirschner
Contributed Papers

Abstract

Magnetic-structure analysis by means of spin-polarization analysis of the secondary electrons in a scanning electron microscope-type (SEM) experiment is demonstrated, using the LEED spin-polarization detector. The advantages in size, handling ability and efficiency, relevant for SEM operation, are pointed out. Limitations and future development are discussed.

PACS

75.50 B 75.65 + 79.20 H 

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Copyright information

© Springer-Verlag 1985

Authors and Affiliations

  • J. Kirschner
    • 1
  1. 1.Institut für GrenzflÄchenforschung und Vakuumphysik, Kernforschungsanlage JülichJülichFed. Rep. Germany

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