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Beobachtung von Gitterdefekten an Silizium-Einkristallen mittels des „Metioskops”

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Literatur

  1. Siehe z. B.: Direct Observations of Imperfections in Crystals, ed. byJ. B. Newkirk, andJ. H. Wernick. New York-London: John Wiley & Sons 1961

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  2. Siehe z. B.: Electron Microscopy and Strength of Crystals, ed. byG. Thomas andJ. Washburn. New York and London: John Wiley & Sons 1963.

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  3. Jakopič, E.: Proc. Eur. Reg. Conf. on Electron Microscopy, Delft 1960, vol. I.

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Authors and Affiliations

  1. Forschungszentrum für Elektronenmikroskopie, Technische Hochschule, Graz

    H. Horn & P. Warbichler

Authors
  1. H. Horn
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  2. P. Warbichler
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Auflicht-Elektronenmikroskop (nachMoellenstedt-Düker) der Fa. Trüb-Täuber, Zürich.

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Horn, H., Warbichler, P. Beobachtung von Gitterdefekten an Silizium-Einkristallen mittels des „Metioskops”. Naturwissenschaften 52, 616–617 (1965). https://doi.org/10.1007/BF00622128

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  • DOI: https://doi.org/10.1007/BF00622128

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