Skip to main content
SpringerLink
Log in

The junction voltage saturation and reliability of semiconductor lasers

  • Papers
  • Published:
Optical and Quantum Electronics Aims and scope Submit manuscript

Abstract

This paper reports theoretical and experimental work on the dependence of semi-conductor laser operation on junction voltage saturation. The relation between junction voltage saturation and the reliability of semiconductor lasers is discussed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. R. A. Barnes andT. L. Paoli,IEEE. Quantum Electron. QE-12 (10) (1976) 633.

    Google Scholar 

  2. W. B. Joyce andR. W. Dixon,J. Appl. Phys. 47 (1976) 3510.

    Google Scholar 

  3. P. D. Wright, W. B. Joyce andD. C. Craft,J. Appl. Phys. 53 (1982) 1364.

    Google Scholar 

  4. M. M. Choy andC. E. Barnes,Electron. Lett. 21 (1985) 846.

    Google Scholar 

  5. P. J. Anthony andN. E. Schumaber,IEEE. Electron Device Lett.,DEL-1, (1980) 58.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Electronic Science, JiLin University, Chang Chun Jilin, People's Republic of China

    Shi Jiawei, Jin Enshun & Gao Dingsan

Authors
  1. Shi Jiawei
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Jin Enshun
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Gao Dingsan
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Jiawei, S., Enshun, J. & Dingsan, G. The junction voltage saturation and reliability of semiconductor lasers. Opt Quant Electron 24, 775–781 (1992). https://doi.org/10.1007/BF00620156

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00620156

Keywords

Search

Navigation