References
M. K. Barnoski andS. M. Jensen,Appl. Opt. 15 (1976) 2112–15.
S. D. Personick,Bell Syst. Tech. J. 56 (1977) 355–66.
T. Uchida andS. Sugimoto,Proceedings of 4th European Conference on Optical Communication Genova (1978) pp. 374–82.
T. Miki andH. Ishio,IEEE Trans. Comm. COM-26 (1978) 1082–87.
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Viljanen, J., Leppihalme, M. Application of OTDR for thickness monitoring of optical thin films. Opt Quant Electron 11, 274–275 (1979). https://doi.org/10.1007/BF00620113
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DOI: https://doi.org/10.1007/BF00620113