Applied Physics A

, Volume 48, Issue 3, pp 237–240 | Cite as

Sensitivity analysis of the modulated photocurrent method

  • G. Aktas
  • C. Z. Çil
  • E. Aktulga
Solids and Materials

Abstract

This study presents a simulation that is used to determine the sensitivity of the phase shift analysis of the modulated photocurrent method to the differences in the fine scale structures in the density of states (DOS) distributions. Four DOS distributions are considered and the expected data are obtained. The results show that the modulated photocurrent method is very sensitive to such fine features in the DOS distributions. A comparison is also made with the sensitivity of other techniques commonly used in the determination of the DOS profiles.

PACS

72.40 

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Copyright information

© Springer-Verlag 1989

Authors and Affiliations

  • G. Aktas
    • 1
  • C. Z. Çil
    • 1
  • E. Aktulga
    • 2
  1. 1.Physics DepartmentBoğaziçi UniversityBebek, IstanbulTurkey
  2. 2.Physics DepartmentMimar Sinan UniversityBeşiktaş, IstanbulTurkey

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