Journal of Superconductivity

, Volume 2, Issue 3, pp 337–349 | Cite as

Atomic structure of grain boundaries and surfaces in YBa2Cu3O7−δ and LaBaCaCu3O7−δ

  • H. W. Zandbergen
  • R. Gronsky
  • G. van Tendeloo
Article

Abstract

High-resolution electron microscopy (HREM) studies of grain boundaries and fractured surfaces in both the tetragonal and orthorhombic phases of dense (>90%) YBa2Cu3O7−δ and tetragonal LaBaCaCu3O7−δ have been conducted. Grain boundaries in polycrystalline YBa2Cu3O7−δ are found to be frequently parallel to a (001) plane of one of the adjacent grains, with a structure similar to that of the (001) surface of fractured YBa2Cu3O7-gd. Matching of experimental and calculated images shows that the outermost surface layer in this compound is a deformed BaO layer. Both grain boundaries and fractured surfaces in LaBaCaCu3O7−δ show no such tendency for preferential orientation of the interface plane. Results indicate that the low critical currents observed in sintered materials are caused by textured grain growth in combination with the atomic structure of the grain boundary plane, and the intercalation of off-stoichiometric species near the grain boundary.

Key words

Grain boundaries electron microscopy YBa2Cu3O7−δ LaBaCaCu3O7−δ 

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References

  1. 1.
    H. W. Zandbergen, R. Gronsky, K. Wang, and G. Thomas,Nature (London) 331, 596 (1988).Google Scholar
  2. 2.
    H. W. Zandbergen, R. Gronsky, and G. Thomas,Phys. Status Solidi (a) 105, 207 (1988).Google Scholar
  3. 3.
    H. W. Zandbergen and G. Thomas,Phys. Status Solidi (a) 107, 825 (1988).Google Scholar
  4. 4.
    H. W. Zandbergen, C. J. D. Hetherington, and R. Gronsky,J. Superconduct. 1, 47 (1988).Google Scholar
  5. 5.
    H. W. Zandbergen and G. Thomas,Acta Crystallogr. A 44, 772 (1988).Google Scholar
  6. 6.
    F. Stucki, P. Breusch, and T. Bauman,Physica C 153–155, 200 (1988).Google Scholar
  7. 7.
    S. Sarian, B. J. Dunbar, and W. J. McEntree, inCeramic Microstructures, Vol. 76, R. M. Fulrath and J. A. Pask, eds. Westview Press, (1976).Google Scholar
  8. 8.
    L. C. DeJonghe,J. Mater. Sci. 14, 33 (1979).Google Scholar
  9. 9.
    I-Nan Lin, R. K. Mishra, and G. Thomas, inAdvances in Materials Characterization, Plenum Press, New York (1983), p. 351.Google Scholar
  10. 10.
    P. Kes,Physica C 153–155, 1121 (1988).Google Scholar
  11. 11.
    S. Nakahara, G. J. Fisanick, M. F. Yan, R. B. Yan, R. B. van Dover, and T. Boone,Appl. Phys. Lett. 53, 2105 (1988).Google Scholar
  12. 12.
    W. T. Fu, H. W. Zandbergen, C. J. van der Beek, and L. J. de Jongh,Physica C 156, 133 (1988).Google Scholar
  13. 13.
    H. W. Zandbergen, W. T. Fu, and L. J. de Jongh,Physica C 156, 307 (1988).Google Scholar
  14. 14.
    D. M. de Leeuw, C. A. H. A. Mutsearts, H. A. M. van Hal, H. Verwey, A. H. Carim, and H. C. A. Smoorenburg,Physica C. 156, 126 (1988).Google Scholar
  15. 15.
    H. W. Zandbergen and L. T. Fu,Physica C, submitted.Google Scholar
  16. 16.
    W. T. Fu, H. W. Zandbergen, C. J. van der Beek, A. A. Verheyen, and L. J. de Jongh,J. Less Common Met. 151, 213 (1989).Google Scholar
  17. 17.
    A. H. Carim, A. F. de Jongh, and D. M. deLeeuw,Phys. Rev. B,38, 7009 (1988).Google Scholar
  18. 18.
    R. Gronsky and G. Thomas, inProceedings of the 41st Annual Meeting, Electron Microscopy Society of America, G. W. Bailey, ed., Claitor's, Baton Rouge (1983), p. 310.Google Scholar
  19. 19.
    D. J. Li, H. Shibahara, J. P. Zhang, L. D. Marks, H. O. Marcy, and S. Song,Physica 156, 201 (1988).Google Scholar
  20. 20.
    L. A. Bursill and X. D. Fan,Physica 107, 503 (1988).Google Scholar
  21. 21.
    J. Halbritter, P. Walk, H. J. Mathes, B. Haeuser, and H. Rogalla,Physica C 153–155, 127 (1988).Google Scholar
  22. 22.
    H. W. Zandbergen, R. Gronsky, M. Y. Chu, L. C. Dejonghe, G. F. Holland, and A. M. Stacy, to be published.Google Scholar
  23. 23.
    H. W. Zandbergen, R. Gronsky, and G. Thomas,Physica C 153–155, 1002 (1988).Google Scholar
  24. 24.
    H. W. Zandbergen, R. Gronsky, and G. Thomas,J. Microsc. Spectrosc. Electron. 13, 307 (1988).Google Scholar
  25. 25.
    A. Umezawaet al., submitted toPhys. Rev. Lett. Google Scholar
  26. 26.
    S. Jin,Proc. Mater. Res. Soc. Fall Meeting, Boston (1987).Google Scholar
  27. 27.
    A. Kapitulnik,Physica C 153–155, 520 (1988).Google Scholar
  28. 28.
    P. Bordet, C. Chaillout, J. Chenavas, J. L. Hodeau, M. Marezio, J. Karpinsky, and E. Kaldis,Nature (London) 334, 596 (1988).Google Scholar

Copyright information

© Plenum Publishing Corporation 1989

Authors and Affiliations

  • H. W. Zandbergen
    • 1
    • 2
  • R. Gronsky
    • 2
  • G. van Tendeloo
    • 3
  1. 1.Gorlaeus LaboratoriesState University LeidenRA LeidenThe Netherlands
  2. 2.National Center for Electron Microscopy, Materials and Chemical Sciences DivisionLawrence Berkeley LaboratoryBerkeley
  3. 3.Universiteit Antwerpen, RUCAAntwerpenBelgium

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