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Journal of Superconductivity

, Volume 1, Issue 1, pp 21–34 | Cite as

Sample preparation of YBa2Cu3O7−δ for high-resolution electron microscopy

  • H. W. Zandbergen
  • C. Hetherington
  • R. Gronsky
Article

Abstract

An overview is given of three techniques for preparing thin specimens of YBa2Cu3O7-δ for high-resolution electron microscopy: grinding, cleaving, and ion milling. Advantages and disadvantages are described, with particular attention to the artefacts that may be introduced by the different techniques. It is concluded that the most serious problem encountered during high-resolution electron microscopy studies is a surface-initiated decomposition leading to the ultimate degradation of the structure. This problem was found to be most pronounced in ion-milled specimens.

Key words

YBa2Cu3O7-δ high-resolution electron microscopy sample preparation 

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Copyright information

© Plenum Publishing Corporation 1988

Authors and Affiliations

  • H. W. Zandbergen
    • 1
  • C. Hetherington
    • 1
  • R. Gronsky
    • 1
  1. 1.National Center for Electron Microscopy, Materials and Chemical Sciences Division, Lawrence Berkeley LaboratoryUniversity of CaliforniaBerkeley

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