Sample preparation of YBa2Cu3O7−δ for high-resolution electron microscopy
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An overview is given of three techniques for preparing thin specimens of YBa2Cu3O7-δ for high-resolution electron microscopy: grinding, cleaving, and ion milling. Advantages and disadvantages are described, with particular attention to the artefacts that may be introduced by the different techniques. It is concluded that the most serious problem encountered during high-resolution electron microscopy studies is a surface-initiated decomposition leading to the ultimate degradation of the structure. This problem was found to be most pronounced in ion-milled specimens.
Key wordsYBa2Cu3O7-δ high-resolution electron microscopy sample preparation
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