Skip to main content
Log in

Spectral investigation of the plasma-chemical etching of silicon dioxide

  • Published:
Journal of Applied Spectroscopy Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Literature cited

  1. A. Jackob, Solid State Technol.,19, No. 9, 70 (1976).

    Google Scholar 

  2. Y. Horiike and M. Shibagaki, Jpn. J. Appl. Phys.,15, No. 1, 13 (1976).

    Google Scholar 

  3. W. R. Harshlarger, R. A. Porter, T. A. Miller, and P. Norton, Appl. Spectrosc.,31, No. 3, 201 (1977).

    Google Scholar 

  4. A. R. Striganov and N. S. Sventitskii, Tables of Spectral Lines of Neutral and Ionized Atoms [in Russian], Atomizdat, Moscow (1966).

    Google Scholar 

  5. R. Pearse and A. Gaydon, The Identification of Molecular Spectra, London (1950).

Download references

Authors

Additional information

Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 30, No. 4, pp. 622–624, April, 1979.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Bosyakov, M.N., Nikiforenko, N.N. & Labuda, A.A. Spectral investigation of the plasma-chemical etching of silicon dioxide. J Appl Spectrosc 30, 434–436 (1979). https://doi.org/10.1007/BF00616172

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00616172

Keywords

Navigation