Abstract
Hall-effect measurements in indium selenide samples doped with different amounts of tin are reported. The temperature dependance of free-electron concentration is interpreted through a single-donor single-acceptor model from which the ionisation energy of the tin related shallow donor (22 meV) and the compensation ratio are obtained. At low temperature the electron concentration departs from activated behaviour and tends to be constant. This can be interpreted through the existance of two-dimensional subbands related to interlayer planar aggregates of donor impurities that are located in energy below the tin-related donor level.
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Marí, B., Segura, A. & Chevy, A. Tin-related shallow donor in indium selenide. Appl. Phys. A 46, 125–129 (1988). https://doi.org/10.1007/BF00615920
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DOI: https://doi.org/10.1007/BF00615920