Abstract
Analysis of the ZnSe-oxide structures formed by anodic oxidation has been performed. Electrooptical properties were analysed as a function of parameters of anodic oxidation by means of the electroluminescence method. Surface properties of ZnSe with a ZnO layer were investigated by using an Auger depth profile analysis. A theoretical treatment of the results based upon the application of thermionic and tunneling theories to double Schottky diodes was assumed.
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References
M.E. Ozsan, J. Woods: Solid State Electr.18, 519 (1975)
C. Lawther, J. Woods: Phys. Stat. Solidi (a)44, 693 (1977)
C. Lawther: Jpn. J. Appl. Phys.18, 849 (1979)
W. Bała, F. Firszt, H. Łożykowski: J. Luminescence28, 204 (1983)
S. Satoh, K. Igaki: Jpn. J. Appl. Phys.19, 1953 (1980)
F. Koshiga, T. Sugano: Thin Solid Films56, 39 (1979)
W. Bała, F. Firszt, Z. Nowak: Proc. on Conf. in Physics, Jaszowiec (1983)6, 308 (1983)
P.W. Palmberg: Anal. Chem.45, 549 (1973)
G.K. Wehner: InMethods of Surface Analysis (Elsevier, Amsterdam 1975), p. 5
C. van Opdorp: Philos. Res. Repts. Suppl. No. 10 (1969)
H. Męczyńska, W. Bała: Acta Physica Polonica64, 167 (1983)
W. Bała: Acta Physica Polonica (in press)
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Bała, W., Bukaluk, A. & Siuda, R. Investigations of ZnSe-ZnO structures, by using the electrooptical and Auger depth profile methods. Appl. Phys. A 37, 231–236 (1985). https://doi.org/10.1007/BF00614822
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DOI: https://doi.org/10.1007/BF00614822