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Journal of Applied Spectroscopy

, Volume 32, Issue 4, pp 388–390 | Cite as

Calculation of the optical constants of thin films with consideration of the surface roughness and the width of the spectrum of the probing radiation

  • B. V. Panasenko
  • A. G. Gusev
  • I. S. Gainutdinov
  • E. A. Nesmelov
  • R. B. Tagirov
Article
  • 11 Downloads

Keywords

Radiation Thin Film Analytical Chemistry Surface Roughness Molecular Structure 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Literature cited

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    M. A. Gisin, G. P. Konyukhov, and E. A. Nesmelov, Opt. Spektrosk.,26, 301 (1969).Google Scholar
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    L. D. Lazareva, E. A. Nesmelov, and M. Kh. Akhmadeev, Zh. Prikl. Spektrosk.,20, 1071 (1974).Google Scholar
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    A. Vašiček, Czech. J. Phys.,13, 36 (1963).Google Scholar
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    I. S. Gradshtein and I. M. Ryzhik, Tables of Integrals, Sums of Series, and Products [in Russian], Fizmatgiz, Moscow (1962).Google Scholar
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    E. A. Voronkova, B. N. Grechushnikov, G. I. Distler, and I. P. Petrov, Optical Materials for Infrared Technology [in Russian], Nauka, Moscow (1965).Google Scholar

Copyright information

© Plenum Publishing Corporation 1980

Authors and Affiliations

  • B. V. Panasenko
  • A. G. Gusev
  • I. S. Gainutdinov
  • E. A. Nesmelov
  • R. B. Tagirov

There are no affiliations available

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