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Use of a low-voltage creeping spark for spectral analysis of chromium-nickel-silicon films on ceramic

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Literature cited

  1. Z. S. Pasheva, G. I. Kurysheva, and G. I. Perevenzentseva, Electronic Equipment, in series: Production Technology and Organization, Vol. 6 [in Russian] (1966), p. 70.

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  2. A. A. Tumanov and V. G. Petukhova, ibid., p. 94.

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  3. N. K. Rudnevskii and L. T. Prokof'eva, Zavod. Lab.,34, 1319 (1968).

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  4. L. S. Zakharov, T. K. Aidarov, E. S. Lakhtionova, and T. A. Koreeva, Zh. Prikl. Spektroskopii,9, 189 (1968).

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 14, No. 5, pp. 911–912, May, 1972.

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Prokof'eva, L.T., Rudnevskii, N.K. & Solov'ev, I.F. Use of a low-voltage creeping spark for spectral analysis of chromium-nickel-silicon films on ceramic. J Appl Spectrosc 14, 669–670 (1971). https://doi.org/10.1007/BF00605812

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  • DOI: https://doi.org/10.1007/BF00605812

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