Journal of Materials Science

, Volume 25, Issue 6, pp 2743–2753 | Cite as

Structure and wear resistance of Ti and TiAl surfaces implanted with B, C, N, O

  • J. C. Pivin
Article

Abstract

The composition and the structure of as-implanted and of worn surfaces were determined by means of several spectroscopies (RBS, NRA and SIMS) and of transmission electron microscopy (TEM). The structural transformations during implantation were often different to those previously reported and new compounds were obtained. The main factor of wear for all films was a local cracking induced by the sinking of a more plastic substrate. When the latter was pure Ti, oxygen diffusion through these cracks and adhesion between stripped areas of Ti and the friction counterpart enhanced the wear process. The contamination of Ti nitrides with O either during implantation or friction appeared also as another important parameter contributing to lessen their wear resistance. Otherwise the kinetics were in the ratio of films hardnesses.

Keywords

Oxygen Polymer Spectroscopy Microscopy Electron Microscopy 

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References

  1. 1.
    H. Holleck,J. Vac. Sci. Technol. A4 no. 6 (1986) 2661.Google Scholar
  2. 2.
    W. D. Münz,J. Vac. Sci. Technol. A4 (1986) 2717.Google Scholar
  3. 3.
    J. W. Jones andJ. Wert,Wear 32 (1975) 363.Google Scholar
  4. 4.
    J. L. Sullivan, T. F. J. Quinn andD. M. Rowson,Tribology International 13 (1980) 153;Wear 65 (1980) 1;Wear 94 (1984) 175.Google Scholar
  5. 5.
    J. E. Sundgren andH. T. G. Hentzell,J. Vac. Sci. Technol. A4 no. 5 (1986) 2259.Google Scholar
  6. 6.
    R. Martinella et al., Mat. Sci. Eng. 69 (1985) 247.Google Scholar
  7. 7.
    R. N. Bolster, I. L. Singer andR. G. Vardiman,Surf. Coat. and Technol. 33 (1987) 469.Google Scholar
  8. 8.
    I. L. Singer et al., ibid. (1988) p. 531.Google Scholar
  9. 9.
    R. G. Vardiman, in Materials Research Society Symposium Proceedings 27 (1984) (Elsevier, Sci. Pub.) p. 699.Google Scholar
  10. 10.
    W. C. Oliver et al., Materials Research Society Symposium Proceedings27 (1984) p. 705.Google Scholar
  11. 11.
    D. Fleche, J. P. Gauthier andP. Kapsa,J. Microsc. Spectrosc. Electron. 10 (1985) 219.Google Scholar
  12. 12.
    R. Hutchings,Mater. Sci. Eng. 69 (1985) 129.Google Scholar
  13. 13.
    J. C. Pivin et al., J., Mater. Sci. 22 (1987) 1087.Google Scholar
  14. 14.
    P. Zheng andJ. C. Pivin,M. O. Ruault, Europhys. Lett. 8 no. 6 (1988) 689.Google Scholar
  15. 15.
    J. C. Pivin andP. Zheng,M. O. Ruault, Phil. Mag. Lett. 59 no. 1 (1989) p. 25.Google Scholar
  16. 16.
    S. Okamoto et al., J. Amer. Ceram. Soc. 66 (1983) C78.Google Scholar
  17. 17.
    J. C. Pivin,Surf. Interf. Anal. 13 (1988) 37.Google Scholar
  18. 18.
    A. Chevarier et al., Trace and Microprobe Techniques 6 (1988) 1.Google Scholar
  19. 19.
    E. Ligeon andA. Bontemps,J. Radioanal. Chem. 12 (1972) 335.Google Scholar
  20. 20.
    M. O. Ruault, J. Chaumont andH. Bernas,Nucl. Instrum. Methods 209–210 (1983) 351;IEEE Trans. Nucl. Sci. 20 (1983) 1746.Google Scholar
  21. 21.
    G. Brault et al., to be published inSurf. Interf. Anal. Google Scholar
  22. 22.
    G. Slodzian, in SIMS III Proceedings, edited by A. Benninghoven, J. Giber, J. Laszlo, M. Riedel, H. M. Werner (Springer Series in Chemical Physics, Springer, Berlin, Heidelberg, New York)19 (1982) 115.Google Scholar
  23. 23.
    J. C. Pivin, C. Roques-Carmes andG. Slodzian,Int. J. Mass. Spectrosc. Ion Phys. 31 (1979) 293 and 311.Google Scholar
  24. 24.
    Idem, ibid. 26 (1978) 219.Google Scholar
  25. 25.
    Idem, J. Appl. Phys. 51 (1980) 4158.Google Scholar
  26. 26.
    Idem J. Microsc. Spectrosc. Electron. 7 (1982) 277.Google Scholar
  27. 27.
    B. Holmberg,Acta Chemica Scan. 16 (1962) 1255.Google Scholar
  28. 28.
    Decker,Acta Crystallogr. 7 (1954) 77.Google Scholar
  29. 29.
    Kugai,Inorganique Material, (English Translations)8 (1972) 669.Google Scholar
  30. 30.
    W. B. Pearson, P. Villars andL. D. Calvert, in “Pearson's Handbook of Crystallographic Data for Intermetallic Phases”, (American Soc. for Metals Pub. 1985, Ohio).Google Scholar
  31. 31.
    R. G. Vardiman, in “ Ion Implantation 1988 ”, edited by F. H. Wohlbier, Defect and Diffusion Forum 57–58 (Trans Tech Pub Suisse.31). Marca (1988) 135–142; marca,Met. Trans. 2 (1971) 465.Google Scholar
  32. 32.
    O. Knotek, H. Bohmer andT. Leyendecker,J. Vac. Sci. Technol. A4 no. 6 (1986) 2695.Google Scholar
  33. 33.
    Ence,J. of Metals 9 (1961) 484.Google Scholar
  34. 34.
    J. C. Schuster andJ. Bauer,J. Solid State Chem. 53 (1984) 260.Google Scholar
  35. 35.
    Marca,Met. Trans. 2 (1971) 465.Google Scholar
  36. 36.
    H. M. Pollock, unpublished work.Google Scholar
  37. 37.
    J. D. J. Ross et al., Thin Solid Films 148 (1987) 171.Google Scholar
  38. 38.
    J. C. Pivin et al., submitted toJ. Phys. D. Google Scholar
  39. 39.
    F. Pons, J. C. Pivin andG. Farges,J. Mater. Res. 2 no. 5 (1987) 580.Google Scholar
  40. 40.
    Y. Mizutani, in “Fundamentals of Tribology”, edited by N. P. Suh and N. Saka (MIT Press, Cambridge, 1980) pp. 223–236.Google Scholar
  41. 41.
    J. L. Sullivan, in “Tribology — Fifty Years On” (Institution of Mechanical Engineers, London, 1987).Google Scholar

Copyright information

© Chapman and Hall Ltd 1990

Authors and Affiliations

  • J. C. Pivin
    • 1
  1. 1.C.S.N.S.M. Bâtiment 108OrsayFrance

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