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An improved lumped capacitance method for dielectric measurement

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Abstract

An improved lumped capacitance method for dielectric measurement in the broad microwave frequency range is proposed, with which many disadvantages occurring in the previous lumped capacitance method can be avoided. It is an easier and more convenient method for the dielectric measurement of ferroelectrics. Experiments have confirmed the feasibility of the method in the low microwave frequency range.

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References

  1. H. Kolodziej, “Dielectric Relaxation in Ferroelectrics of the Order-Inorder Type”, in “Dielectric and Related Molecular Processes, Vol. 2. A Specialist Periodical Report” (The Chemical Society, Burlington House, London, 1975) pp. 249–87.

    Google Scholar 

  2. A. R. Von Hippel, “Dielectric Materials and Applications” (M.I.T. Press, Cambridge MA, 1954).

    Google Scholar 

  3. S. S. Stuchly, A. Kraszewski andM. A. Stuchly, “Uncertainties in Radiofrequency Dielectric Measurement of Biological Substances”.IEEE Trans. Instrum, and Meas. IM-36 (1) (1987) 67.

    Google Scholar 

  4. T. W. Athey, M. A. Stuchly andS. S. Stuchly, “Measurement of Radiofrequency Permittivity of Biological Tissues with an Open-End Coaxial Line—part I”IEEE Trans. Microwave Theory Tech. MTT-30 (1982) 82.

    Google Scholar 

  5. M. A. Rzepecka andS. S. Stuchly, “A Lumped Capacitance Method for the Measurement of the Permittivity and Conductivity in the Frequency and Time Domain — A Further Analysis”IEEE Trans. Instrum, and Meas. IM-24 (1) (1975) 27.

    Google Scholar 

  6. S. S. Stuchly, M. A. Rzepecka andM. F. Iskander, “Permittivity Measurements at Microwave Frequencies Using Lumped Elements”IEEE Trans. Instrum, and Meas. IM-23 (1) (1974) 56.

    Google Scholar 

  7. W. L. Bellamy, S. O. Nelson andR. G. Leffler, “Development of a Time-Domain Reflectometry System for Dielectric Properties Measurement”Trans, of the ASAE,28 (4) (1985) 313.

    Google Scholar 

  8. H. E. Green, “The Numerical solution of Important Transmission Line Problems”IEEE Trans, on Microwave Theory and Tech. MTT-13 (5) (1965) 676.

    Google Scholar 

  9. M. A. Stuchly andS. S. Stuchly, “Coaxial Line Reflection Methods for Measuring Dielectric Properties of Biological Substances at Radio and Microwave Frequencies — A-Review”IEEE Trans, on Instrum. and Meas. IM-29 (3) (1980) 176.

    Google Scholar 

  10. Landolt-Bornstein, “Numerical Data and Functional Relationships in Science and Technology, Vol. 2 Band 2”, (Springer-Verlag, Berlin, 1969) pp. 68–69.

    Google Scholar 

  11. M. F. Iskander andS. S. Struchly, “Fringing Field Effect in the Lumped Capacitance Method for Permittivity Measurement”IEEE Trans, on Instrum. and Meas. IM-27 (1) (1978) 107.

    Google Scholar 

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Authors and Affiliations

  1. Department of Physics, Shandong University, People's Republic of China

    A. Lian & W. Zhong

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  1. A. Lian
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  2. W. Zhong
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Lian, A., Zhong, W. An improved lumped capacitance method for dielectric measurement. J Mater Sci 25, 4349–4355 (1990). https://doi.org/10.1007/BF00581094

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  • DOI: https://doi.org/10.1007/BF00581094

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